IEEE Transactions on Information Forensics and Security (TIFS)に以下の論文の採録が決定しました．
Michihiro Shintani, Aoi Ueda, and Takashi Sato, “Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation,” IEEE Transactions on Power Electronics (TPEL), (accepted for publication) doi: 10.1109/TPEL.2021.3118057.